Photoelectron X-ray Microscopy

نویسندگان

  • F. Polack
  • S. Lowenthal
چکیده

The soft-X ray range, between 1-10 nm wavelength, is highly interesting for X-ray microscopy. Taking advantage of it requires, however, to operate a high resolution instrument at a variable wavelength. We describe here an image converter X-ray microscope which is based on secondary pharoemission. This instrument is now developped at the Institut dlOptique (Orsay); it will be installed near ACO storage ring (LURE, Orsay) and should have a 50 nm resolution.

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تاریخ انتشار 2016